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Metodologie didattiche per l'Università

No. 1 (2022): La giornata dedicata alle donne e alle ragazze nella scienza

Le microscopie a scansione di sonda

Submitted
2 April 2022
Published
03-04-2022

Abstract

Nanoscience and the study of matter on the nanoscale, using modern microscopy techniques, represent an extremely useful and powerful tool for introducing concepts of quantum mechanics from the educational point of view. We have illustrated the basic principles of scanning probe microscopies most used in research laboratories and industries: scanning tunneling and atomic force microscopy, both capable of measuring the physical and electronic properties of matter on the atomic scale and in real time.

References

  1. G. Binning, H. Rohrer, Surf. Sci. 1983, 126, 236.
  2. G. Binning, H. Rohrer, C. Berger, E. Weibel, Phys. Rev. Lett., 1982, 49, 57.
  3. G. Binnig, et al., Phys. Rev. Lett., 1986, 56, 930.
  4. G. Binnig, et al., Scientific American, 1985, 253, 40.
  5. C. F. Quate, Physics Today, 1986, 39, 26.
  6. R. P. Feynman, Engineering and Science, 1960, 23, 22.
  7. Scanning Probe Microscopy and Spectroscopy: Theory, Techniques, and Applications, 2nd Edition, Dawn Bonnell (Editor), ISBN: 97804712482.
  8. R. M. Feenstra, J. Stroscio, A. Fein, Surf. Sci. 1987, 181, 295.
  9. A. Sgarlata et al., Surf. Sci., 2000, 466, 167.
  10. D. J. Griffiths, Introduzione alla meccanica quantistica, F. Ciccacci (Curatore), L. Quartapelle Ed. CEA, 2005 EAN: 97888080874784-8.
  11. J. Tersoff, D. R. Hamann, Phys Rev Lett, 1985, 50, 1998.
  12. M. R. Castell, S. L. Dudarev, C. Muggelberg, A. P. Sutton, G. A. D. Briggs, J. Vac. Sci. Technol. A, 1998, 16, 1055.
  13. K. Krupski, M. Moors, P. Jóźwik, T. Kobiela, A. Krupski, Materials, 2015, 8, 2935.
  14. A. Selloni, P. Carnevali, E. Tosatti, C. D. Chen, Phys. Rev. B, 1985, 31, 2602(R); Erratum Phys. Rev. B, 1986, 34, 7406.
  15. L. Di Gaspare, A. Scaparro, M. Fanfoni, L. Fazi, A. Sgarlata, A. Notargiacomo, V. Miseikis, C. Coletti, M. De Seta, Carbon, 2018, 134, 183.
  16. R. M. Feenstra, J. A. Stroscio, J. Tersoff, A. P. Fein, Phys. Rev. Lett., 1987, 58, 1192.
  17. A. N. Chaika, High Resolution STM Imaging Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM), in Surface science tools for nanomaterials characterization, CSSR Kumar Editor, Springer Berlin Heidelberg, 2015.
  18. M. F. Crommie, C. P. Lutz, D. M. Eigler,1933, Science, 262, 218.
  19. D. M. Eigler, E. K. Schweizer, Nature, 1990, 344, 524.
  20. Y. Jiao, D. I. Cherny, G. Heim, T. M. Jovin, T. E. Schäffer, J. Mol. Biol., 2001, 314, 233.
  21. D. J. Müller, et al., J. Mol. Biol., 1995, 249, 239.
  22. Y. F. Dufrêne, et al, Nature Nanotech., 2017, 12, 295.
  23. S. Hembacher, F. J. Giessibl, J. Mannhart, C. F. Quate, Proc. Natl. Acad. Sci., 2003, 100,12539.
  24. F. J. Giessibl, et al., Science, 2000, 289, 422.
  25. F. J. Giessibl, G. Binning, Ultramicroscopy, 1992, 42, 281.
  26. F. J. Giessibl, Materials Today, Maggio 2005.
  27. Y. Sugimoto, et al., Nature Mater., 2005, 4, 156.